G09100 - SEMI G91 - Standard Test Data Format (STDF) Memory Fail Datal

NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use.   The purpose of this Standard is to provide a common format for memory fail datalog specification along with necessary synchronization information enabling an efficient dataflow for volume diagnostics applications for memories.   The purpose of this Standard is to provide a standard format to log electrical failure information during test for embedded as well as stand-alone memories. The Standard provides the definition of records and their use for storing failure information. The scope of the proposed Standard is the memory failure information collected during electrical test for embedded as well as stand-alone volatile memories.   Referenced SEMI Standards (purchase separately) None.  

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STDF Memory Fail Datalog Standard

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Figure 3 from Employing the STDF V4-2007 Standard for Scan Test Data Logging

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Figure 5 from STDF Memory Fail Datalog Standard

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